Photocurrent Spectroscopy Applied to Semiconductor Thin Films: CDS

Authors

  • Pedro Azuero Facultad de Ciencias, Universidad Nacional de Ingeniería, Lima - Perú
  • Guido Castillo Ocaña Facultad de Ciencias, Universidad Nacional de Ingeniería, Lima - Perú
  • Aníbal Valera Palacios Facultad de Ciencias, Universidad Nacional de Ingeniería, Lima - Perú

DOI:

https://doi.org/10.21754/tecnia.v11i2.517

Abstract

In this work, we present results of spectral photocurrent measurements in the quantitative diagnostic of semiconductors, in the specific case of cadmium sulfide (CdS) thin films. We present three measurement modalities. The results are each other complementary and confirms, that
the most relevant energy levels in CdS, from the photoelectric point of view, correspond to the values: 2,0; 2,26; 2,38; 2,47 and 2,60 eV

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References

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Published

2001-12-01

How to Cite

[1]
P. Azuero, G. Castillo Ocaña, and A. Valera Palacios, “Photocurrent Spectroscopy Applied to Semiconductor Thin Films: CDS”, TECNIA, vol. 11, no. 2, Dec. 2001.

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