Photocurrent spectroscopy applied to thin film solar cells based on hydrogenated amorphous silicon (a-Si:H)

Authors

  • Aníbal Valera Palacios Facultad de Ciencias, Universidad Nacional de Ingeniería. Lima, Perú.
  • Marco Valentin Siu Facultad de Ciencias, Universidad Nacional de Ingeniería. Lima, Perú.

DOI:

https://doi.org/10.21754/tecnia.v15i2.419

Keywords:

thin films, amorphous silicon, photocurrent measurements, solar cells

Abstract

Using photocurrent spectroscopy, we report measurements of the photo responde below the optical gap in hydrogenated amorphous silicon (a-Si:H). The a-Si:H films were grown in a non conventional DC plasma assited discharge chamber. The measurements suggest that the density of states of this material is not very different than conventional intrinsic a-Si:H (device-quality) and not so extended as usually taken. The positions of the corresponding photovoltaic transition energies are determined and agree very well with known data obtained by other methods.

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References

[1] Schreiber, R.,"Barriereenhoehen verschiedener Metalle auf amorphem Silizium un amorphen Silizium-Mischhalbleiter uns Sub-Gap-Absorptionsmessungen an Schottky Strukturen", Diplomarbeit, IPE Universitaet Stuttgart 1986.

[2] Heck, S., "Untersuchung von lichtinduzierte Defekte des hydrogenisiertem amorphen Siliziums", Dissertation, Uni. Marburg 2002.

[3] Mensing, G., et al. "Defect transition energies and the density of electronic states in hydrogenated amorphous silicon", J. Non- Cyst. Solids pp. 299-302, (2002) pp. 621-625.

[4] Ed. By J.I. "Pankove Semiconductors and semimetals" (Academic, New York, 1984).Vol. 21

[5] W.B. Jackson, N.M. Amer., "Phys. Rev. B" 25, 5559 (1982).

[6] Amato, G., et al. "J. Appl. Phys", pp.71, 3479 (1992).

[7] Platz, R., et al, "J. Non-Cyst. Solids", pp. 164-166, 355, (1993).

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Published

2005-12-01

How to Cite

[1]
A. Valera Palacios and M. Valentin Siu, “Photocurrent spectroscopy applied to thin film solar cells based on hydrogenated amorphous silicon (a-Si:H)”, TEC, vol. 15, no. 2, pp. 5–11, Dec. 2005.

Issue

Vol. 15 No. 2 (2005)

Section

Articles

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Copyright (c) 2005 TECNIA

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