Rietveld method for the study of crystal structures
Keywords:
Rietveld method, X-ray diffraction.Abstract
This work describes and applies the Rietveld Method for the refinement of a crystalline structure. The Rietveld Method consists on a theoretical adjustment of the diffraction pattern using a model including both structural and experimental factors. The initial reference values of the parameters are modified adjusting the complete profile of the powder diffraction pattern of our sample.
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References
R. A. Young, The Rietveld Method. International Union of Crystallography, Oxford Science Publications, (1996).
B. D. Cullity, et al, Elements of X-Ray Diffraction, Prentice Hall, (2001).
S. A. Howard and KJ. D. Preston, (Modern Powder Diffraction, Reviews in Mireralogy volume 20)
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Takashi Ida, The Rigaku Journal, Vol. 19, (2002).
Norberto Masciocchi, The Rigaku Journal, Vol. 14 (1997).
D. Louër and E. J. Mittemeijer, Powder Diffraction in Material Science, (2000).
Juan Rodriguez Carvajal, An Introduction to the Program Fullprof, (2001).
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